Temperature Measurment & Optics Applying
Silicon Wafer Substrate
Monocrystalline Silicon
+-2% @10.6um
0/-0.15mm
+/-0.05mm
2-5um @ Tave Less Than 1%; 5.5-14um @Tave More Tha
Less Than 1 Arc Min
60-40 Scratch-Dig
Optoelectronic Semiconductor
Element Semiconductor
Customize as Per Demand
Analog Digital Composite and Function
as Per Demand
100PCS Per Carton
custom as per demand