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R&S Rtm3000 Oscilloscope Rohde & Schwarz图1R&S Rtm3000 Oscilloscope Rohde & Schwarz图2R&S Rtm3000 Oscilloscope Rohde & Schwarz图3R&S Rtm3000 Oscilloscope Rohde & Schwarz图4R&S Rtm3000 Oscilloscope Rohde & Schwarz图5R&S Rtm3000 Oscilloscope Rohde & Schwarz图6

R&S Rtm3000 Oscilloscope Rohde & Schwarz

Price $0.00
Min Order 1 Piece  
Shipping from Guangdong, China
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Product details
RTM3000
12 Months
12 Months
1 Week Delivery
Rohde & Schwarz
Box
China
Product Description
Product Description
R&S RTM3000 oscilloscope Rohde & Schwarz

Key facts

  • Bandwidth: 100 MHz to 1GHz
  • Sample rate: up to 5 Gsample/s
  • Memory depth: up to 80 Msample
  • ADC resolution: 10-bit
  • Display: 10.1'' capacitive touchscreen
  •  

See more of your signal with the power of 10

Designed as daily problem-solving tool, the R&S®RTM3000 combines the power of ten (10-bit ADC, 10 times the memory and 10.1" touchscreen) with a Rohde & Schwarz probe interface for all Rohde & Schwarz probes.

  • Four times more vertical resolution than standard 8-bit ADCs
  • Maintains fast sampling rates at all times
  • 10.1" touchscreen with gesture support
  •  
Signal analysis: quick results
See small signal details in the presence of large signals
The R&S RTM3000features a customized Rohde & Schwarz designed 10-bit A/D converter that delivers
a four-fold improvement over conventional 8-bit A/D converters. The increased resolution results in
sharper waveforms with more signal details that would otherwise be missed. One example is the
characterization of switched-mode power supplies. The voltages across the switching device must be
determined during the on/off times within the same acquisition.
Segmented memory
40 Msample standard and 80 Msample interleaved
The R&S@RTM3000 offers a class-leading memory depth: 40Msample per channel are available, even
80 Msample in interleaved mode. This is eight times more than similar oscilloscopes in the same
instrument class. The user captures longer acquisition sequences even at high sampling rates for more
analysis results, e.g. when analyzing transients of switched-mode power supplies.
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